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加速寿命试验对半导体桥火工品安全性能的影响研究

时间:2021-03-01 21:52来源:毕业论文
通过对SCB进行加速寿命试验,并对加速寿命试验后的试样进行静电放电试验(ESD)及1A1W5min恒流试验,分析得到了贮存对SCB的外观、电性能、恒流安全性能及静电安全性能的影响规律

摘要本文研究了加速寿命试验对半导体桥(SCB)火工品安全性能的影响规律,通过对SCB进行加速寿命试验,并对加速寿命试验后的试样进行静电放电试验(ESD)及1A1W5min恒流试验,分析得到了贮存对SCB的外观、电性能、恒流安全性能及静电安全性能的影响规律。研究结论如下:63831

(1)贮存后,SCB脚线出现腐蚀现象,涂覆银浆的键合区没有腐蚀现象,不涂覆银浆的键合区出现腐蚀;

(2)贮存前后及静电放电前后SCB电阻几乎没有改变;

(3)贮存后SCB火工品的静电放电安全性能没有改变,恒流安全性能满足1A1W5min不发火的要求;

(4)静电放电试验、1A1W5min恒流试验后SCB的发火性能均发生了改变。

毕业论文关键词  火工品  半导体桥  加速寿命试验  电性能  安全性能

毕业设计说明书(论文)中文摘要

毕业设计说明书(论文)外文摘要

Title  Study on the influence of Accelerated Life Test on the safety performance of semiconductor bridge explosive initiators

Abstract This paper mainly studies how Accelerated Life Test(ALT) affects the safety performance of semiconductor bridge (SCB) explosive initiators.By having an Accelerated Life Test on SCB and after which having the electrostatic discharge(ESD)and 1A1W5min Constant Current Test on the sample before,the paper shows the regular of the influence of the storage on the appearance of SCB,electrical performance and the safety performance of constant current and static electricity.Conclusion goes that:

(1)After storage, SCB crural line appears corrosion phenomenon,the bonded area has no corrosion phenomenon which is coated with silver paste ,the one that is not coated with silver paste appears corrosion;

(2)There is no change on the electrical performance of SCB before or after the storage and the electrostatic discharge;

(3)The SCB after storage has no change on the safety performance of static electricity,the constant current safety performance test meets the requirements of not firing performance of 1A1W5min;

(4)Ignition quality after ESD and 1A1W5min Constant Current Test changed.

Keywords  explosive initiators  semiconductor bridge  ALT  electrical performance  safety performance

1  绪论 1

1.1  研究背景及意义 1

1.2  SCB火工品简介 2

1.3  国内外研究状况 3

1.4  本文的主要研究内容 5

2  加速寿命试验理论与设计 6

2.1  加速寿命试验理论 6

2.2  加速寿命试验类型的选择 7

2.3  加速寿命试验应力的确定 8

2.4  加速寿命试验样品设计 8

3  加速贮存对SCB外观及电性能的影响分析 10

3.1  贮存对脚线和SCB键合区的影响与分析 10

3.2  贮存前后SCB火工品电性能变化分析 13

3.3  小结 14

4  加速寿命试验后的静电安全性研究 15

4.1  静电放电的干扰机理 15

4.2  静电放电的损伤机理 15

4.3  静电放电试验 16 加速寿命试验对半导体桥火工品安全性能的影响研究:http://www.751com.cn/huaxue/lunwen_70612.html

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